JEOL 3000F Field Emission TEM (with Gatan Image Filter system)

High Resolution Transmission Electron Microscopy (HR-TEM)
X-ray Dispersion Spectroscopy (XDS)
Electron Energy Loss Spectroscopy (EELS)
Energy Filtered Transmission Electron Microscopy (EF-TEM)
Scanning Transmission Electron Microscopy (STEM)
Z-contrast Scanning Transmission Electron Microscopy (Z contrast STEM)
Convergent Beam Electron Diffraction (CBED)
Electron Holography
CCD ready